Industry Expert to Speak at IMTS Olympus Booth
August 1, 2014
Olympus DSX100
Olympus will have its experts available for product demonstrations at IMTS on September 8-13, in Chicago.
Featured industry expert Dr. Chris Brown, PE, FASME, will provide insight on topics such as the value of surface metrology and measurement and analysis of surface roughness through a series of in-booth talks at Olympus booth #E5623. His speaking schedule (subject to change) is as follows:
Monday, September 8 and Thursday, September 11
- 10:30 a.m.- Roughness Beyond Ra: The Value and Science of Surface Metrology
- 1 p.m.- Measuring and Analyzing the Roughness of Machined Surfaces
- 3 p.m.- Measuring and Analyzing the Roughness of Surfaces Made by Additive Manufacturing
Tuesday, September 9
- 9:30 a.m.- Roughness Beyond Ra: The Value and Science of Surface Metrology
Wednesday, September 10
- 12:30 p.m.- Roughness Beyond Ra: The Value and Science of Surface Metrology
- 2:30 p.m.- Measuring and Analyzing the Roughness of Machined Surfaces
- 4 p.m.- Measuring and Analyzing the Roughness of Surfaces Made by Additive Manufacturing
The Olympus booth will be exhibiting the OLS4100 and DSX100 microscope systems as well as Stream and Inspector software. Select NDT products such as the DELTA Professional, IPLEX RT/RX, EPOCH 600, 38DLP, OmniScan SX and the new NORTEC 600 will also be featured.
- The LEXT OLS4100 laser confocal microscope system is designed to deliver nanometer-level imaging, accurate 3D measurement and outstanding surface roughness analysis. The OLS4100 features new auto brightness and high-speed stitching modes.
- DSX100 opto-digital microscope technology combines cutting-edge optical performance (opto) with the operational convenience (digital) of a smartphone or tablet, allowing users to easily create, process and share high-resolution digital images.
- Stream micro-imaging software allows users to seamlessly acquire, process and measure images, then create valuable data and reports. Stream 1.9 includes a host of features designed to further enhance workflow and simple, flexible system operation.
- Developed in response to increasing requirements for particle counting and cleanliness inspection, the newly updated Inspector 5.64 image analysis software provides accurate and reproducible particle detection, measurement and documentation.
For more information contact:
Olympus America
3500 Corporate Parkway
Center Valley, PA 18034
484-896-5822
www.olympus-ims.com
IMTS 2014 Booth E-5623
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