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CMMs, Advanced Metrology Software and CMM Accessory Products

The LK Multi-Sensor ALTERAC equipped with LK's new laser and roughness scanners.

New TouchDMIS metrology software to be introduced at IMTS.

LK Metrology, Inc. will be exhibiting a variety of new products at IMTS in booth 135230.

Four different CMMs will be displayed and demonstrated, including: the LK ALTERA M SCANTEK 5 equipped with a Renishaw REVO-2 5-axis scanning system; the LK Multi-Sensor ALTERAC equipped with LK's new blue line laser scanner and a new surface roughness probe; the new ALTO 6x5 Bench Top CMM; and a new COORD 3 UNIVERSAL CMM with a TP200 touch probe. CMMs with PH20 and PH10 probes will also be on display.

LK will be launching an advanced version of its TouchDMIS software as well as demonstrating the newest version of its CAMIO programming and measuring software. The new Industry 4 Metrology Gate, LK's portal for remote inspection monitoring, will also be shown and demonstrated. Other CMM software like Renishaw Modus, Polyworks and CMM Manager, which are frequently used with LK Metrology CMMs, will also be available for demonstration.

Related accessory products to be seen will include LK's new SLK20 blue light line laser scanner, a new LK surface roughness probe and a new LK FREEDOM V2 measuring arm with rotary indexing table.

For more information contact:

LK Metrology, Inc.

29550 W.K. Smith Drive, Unit B

New Hudson, MI 48165


IMTS East Building, Level 3

Booth 135230

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