The new generation Waveline W800 and W900 measuring systems from Jenoptik are modular measuring systems designed for flexible, precise roughness and contour measurements.
The new Waveline W800 and W900 systems offer four available probe systems, two of which are capable of measuring both roughness and contour measurements. Designed with a quick change adapter (QCA), each probe system can be removed and replaced quickly and efficiently, allowing the operator to retool the system at a moment's notice. Available probe arms also come standard with magnetic couplings, simplifying probe arm replacement across the platform.
Overall speed has also been significantly increased, with the W800 capable of 20 mm/s positioning, for fast, accurate results. The W900 is capable of 200 mm/s positioning speed, with a positioning repetition of <10 um, helping users to reduce inspection cycle times, increase output and reduce overall costs.
Accuracy is a critical component of any metrology system and the Waveline W800 and W900 systems deliver a resolution down to 0.3 Nm.
Parameter-Oriented Operation
The improved productivity is enhanced by the evaluation software Evovis. The graphical, function-oriented user interface is designed to provide simple operation even for complex measuring tasks. Besides evaluation and presentation of all surface and contour parameters, the software also includes automatic system configuration when changing the probe system or the probe arm. For continuous monitoring of the production process, all measurement results can be transferred to a central statistics server via qs-STAT.
Twist Measurement According to Daimler Standard
Standard options of this class of measurement device include second generation twist measurement for rotating seal surfaces on crank or gear shafts according to Daimler standard MBN 31007-07. Twist measurement is used to evaluate the dynamic sealing properties of a surface using shaft seals. "According to the current Daimler standard MBN 31007-07 from 2009, all new parameters such as theoretical feed cross section per revolution DFu, or the contact length in percent DLu, can be determined using optimized evaluation algorithms. Due to optimized evaluation, the measurement results are much more stable, and the reduction of the evaluation length from 5 mm to 2 mm constitutes a significant time savings," said a company spokesperson.
Depending on the type of application and measurement task, the new roughness evaluation devices are available as either a compact desktop version or a complete ergonomic measurement work station. "The integrated system design and state-of-the-art probe systems of the W800 and W900 product line provide a high degree of flexibility for daily measuring tasks," said the spokesperson.
For more information contact:
Jenoptik Industrial Metrology
1500 West Hamlin Rd.
Rochester Hills, MI 48309
248-853-5888
www.jenoptik.com/industrial-metrology