CMSC 2013 Measurement Study Report

The Coordinate Metrology Society (CMS) has announced the results of its fourth large-scale measurement study performed at the 29th annual Coordinate Metrology Systems Conference (CMSC) held in San Diego, CA. The study was developed to support the CMS Level II Certification Examination development process, which will culminate in an instrumentation-based certification program for portable 3D metrology. The study's main focus was to evaluate how decisions made during and after measurement affect the final measurement result. The 50-page report, entitled "Non-Contact Scanning: How Data is Affected by the Decisions We Make," details the results and analysis of the interactive measurement study. Professionals in the metrology field work in diverse industries such as aerospace, automotive, power generation and more. The new report is now available for CMS members.

Over a two day period, CMSC conference attendees participated in the data collection activity in the Measurement Study booth. The objective of the study was to engage the CMSC community in the practical methodology required to support certified operators and programmers. In addition, participants were asked to evaluate the appropriateness of the tasks in relation to the CMS Certification development. Four stations accommodated participants carrying out practical tasks using a portable articulating arm and a scanning system. Six Analysis Stations were available to observe decisions made while interpreting data, and examine how those choices can influence measurement results. The exercise provided a hands-on challenge for participants regardless of their expertise with scanning systems or knowledge of metrology. A workshop was held on the third day of the conference to review the results and to learn about future measurement studies for CMSC.

The study was coordinated by the National Physical Laboratory (UK) and event sponsor Metrologic Group, assisted by members of the CMS Certification Committee, Coventry University and volunteers from many OEMs and software developers in the metrology industry. Author Keith Bevan from the National Physical Laboratory performed statistical analysis of the study and compiled those conclusions into the new report, which was peer-reviewed by the organization's Executive and Certification Committees.

For more information contact:

Coordinate Metrology Society

www.cmsc.org