New SFP2 Increases Surface Finish Measurement Ability of REVO System
May 1, 2018
Renishaw offers the SFP2 - a new surface finish measurement probe - for use with its REVO 5-axis measurement system on CMMs.
The SFP2 probe has the ability to increase the surface finish measurement ability of the REVO system, which offers a multi-sensor capability providing touch-trigger, high-speed tactile scanning and non-contact vision measurement on a single CMM.
"Combining surface finish measurement and dimensional inspection on the CMM presents advantages over traditional inspection methods requiring a separate process," said a company spokesperson. "Powered by 5-axis measurement technology, the SFP2's automated surface finish inspection offers time savings, reduced part handling and greater return on CMM investment."
The SFP2 system consists of a probe and a range of modules and is automatically interchangeable with all other probe options available for REVO. This provides the flexibility to easily select the optimum tool to inspect a wide range of features on the same CMM platform. Data from multiple sensors is automatically referenced to a common datum.
The surface finish system is managed by the same I++ DME compliant interface as the REVO system, and full user functionality is provided by Renishaw's MODUS metrology software.
Renishaw's REVO 5-axis measurement system is a scanning system for CMMs that simultaneously controls the motion of three machine and two head axes while collecting workpiece data. Using its range of 2-D and 3-D tactile probes, surface finish measurement and non-contact vision probes, the REVO system brings speed and accuracy benefits to part inspection on CMMs.
For more information contact:
Renishaw, Inc.
1001 Wesemann Dr.
West Dundee, IL 60118
847-286-9953
usa@renishaw.com
www.renishaw.com/en/sfp2
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