Mitutoyo Corporation has released the TAGLENS series of products. Suitable for demanding inspection applications such as non-contact ultra-high-speed inspection systems, the TAGLENS series reduces the need for mechanical focusing modules.
The patented technology powering the TAGLENS series of products was invented at Princeton University by a team led by Professor Craig B. Arnold, a material scientist and laser expert. It was later developed and commercialized by TAG Optics Inc., a company co-founded by Arnold and Princeton alumnus Christian Theriault to bring the technology to market. In 2016, Mitutoyo acquired a controlling interest in TAG Optics Inc. with the intention to further develop the technology.
Mitutoyo's TAGLENS-T1 represents a new and improved embodiment of the technology, capable of being used in demanding industrial and harsh environment while maintaining nano-second level resolution due to its controller. "Manufactured in the U.S. by Mitutoyo Optics Manufacturing America Corporation (Kirkland, WA), the TAGLENS is the first ultra-high-speed variable focusing lens capable of operating in tough industrial environments," said a company spokesperson. An optional SDK enables customers to integrate the TAGLENS-T1 into their own system.
The TAGLENS-T1 has the ability to change focus in 70 kHz enabling productivity and cost improvement across a wide range of quality assurance processes. The TAG Technology already has been used in a variety of markets and can benefit packaging and manufacturing sites in sectors such as electronics, molded parts manufacturing, medical, food packaging, etc. "Due to its focusing speed, which is much faster than mechanical systems, the TAGLENS-T1 can increase the depth-of-field of any optical system," said the spokesperson. "The TAGLENS-T1 is also the first variable focus lens capable of withstanding large amounts of vibrations and shock or being mounted on robotic arms while maintaining optical performance."
"Also part of the TAGLENS product launch is the Mitutoyo VMU-T1: the first commercial system to incorporate the TAG technology," added the spokesperson. "The unique combination embodied in the VMU-T1 results in a powerful inspection tool which, when using Mitutoyo's M Plan Apo Series of objectives, generates imaging depth-of-field capabilities that are up to 20 times greater than other similar microscopy inspection systems." Such an increase in depth-of-field reduces the need for mechanical z-motion and thereby reduces the time needed to inspect parts with complex geometry.
For more information contact:
Mitutoyo America Corporation
965 Corporate Blvd.
Aurora, IL 60502
630-820-9666 / 888-648-8869
marketing@mitutoyo.com
www.mitutoyo.com