The Coordinate Metrology Society (CMS) has formally issued a call for technical papers for the 35th annual CMS Conference (CMSC) to be held July 22 - 26, in Orlando, FL. The CMSC provides an inclusive knowledge platform for subject matter experts from the portable and traditional coordinate measurement machine (CMM) communities. Author practitioners are encouraged to submit abstracts covering technological advancements, research findings, successful implementations and best practices.
Topics and Publication
The CMS seeks original, expert contributions or major developments in previously reported work on topics that include, but are not limited to: case studies, technology benchmarks, metrology solutions for automation, process control, assembly and more, as well as other Smart Factory trends that unlock the potential of 3-D metrology technologies. "Each new harvest of technical papers serves to introduce next-generation ideas and forge a collaborative bridge between professionals with different skill levels, as metrology becomes more impactful across the manufacturing domain than any time before," said a spokesperson.
Submissions are accepted from master practitioners working in the portable and traditional CMM fields. Commercial content is not accepted by the CMS. All technical papers that are presented at CMSC 2019 will be reviewed, scored and selected by the CMS Executive Committee for publication in the Journal of the CMSC. Authors and researchers are also encouraged to cite CMSC technical papers if referenced in their own technical papers. To download the comprehensive CMSC Technical Paper Guidelines document, go to www.cmsc.org/call-for-papers and click on "CMSC Technical Paper Guidelines."
Important Dates
Authors must submit their abstracts to the CMS by March 8, 2019. Each abstract is peer-reviewed by the CMS Executive Committee, and if selected, the author will receive a Notification of Acceptance on April 5, 2019. Conference registration and membership fees are waived for accepted individual speakers. In the case of multiple authors, the CMS will waive one conference registration and membership fee. For more information, contact Daniel Sawyer or Keith Bevan, Technical Presentations Coordinators at presentations@cmsc.org.
Since 1984, more than 525 original technical papers have been presented. The organization maintains a digital library of more than 100 technical papers delivered at the CMSC over the past 12 years. Ideal for research, this is a comprehensive repository of metrology knowledge and information.
For more information contact:
CMS
2537 Elk Hollow Lane
Weatherford, TX 76085
425-802-5720
presentations@cmsc.org
www.cmsc.org/call-for-papers