Olympus Vanta Element X-ray fluorescence (XRF) analyzer
"Easy to learn, fast to use and weighing a slim 2.9 lbs. (1.32 kg), the Vanta Element X-ray fluorescence (XRF) analyzer is up to the challenge of all day, high-throughput testing," said an Olympus spokesperson.
The Vanta Element analyzer offers speed and ease of use in a variety of testing environments, including scrap recycling and metal manufacturing. Users can obtain clear material and grade I.D. in seconds and compare alloy grades on the instrument's screen. "With a dual-core processor and powered by Olympus' Axon Technology, the Vanta Element analyzer has the same stability and resolution as the rest of the Vanta series for rapid sorting and a fast ROI," said the spokesperson.
Built for use in demanding environments, Vanta Element analyzers are IP54 rated for resistance to dust and moisture and constructed to pass a 4' drop test (MIL-STD-810G) to help keep customers working in case of an accidental drop or impact. For additional protection, a stainless steel faceplate is paired with a thick (50 µm) Kapton window that can be easily attached and removed for toolless window changes in the field. The Vanta Element analyzer performs continuously in temperatures from -10 °C to 45 °C (14 °F to 113 °F).
With optional wireless connectivity, users can connect to the Olympus Scientific Cloud for wireless data sharing and access to a fleet of management tools, the Olympus mobile app or the user's own network, helping future-proof it for Industry 4.0.
The analyzer has an industrial 1 GB microSD card for storing results and two USB ports for easy data export. For added flexibility, the Vanta Element analyzer is compatible with accessories including the Vanta field stand, soil foot, probe shield and holster.
For more information contact:
Olympus Scientific Solutions Americas
48 Woerd Avenue
Waltham, MA 02453
800-225-8330
www.Olympus-IMS.com