High Precision Contour and Roughness Measuring System
March 1, 2015
The Jenoptik surfscan system provides simultaneous acquisition of roughness and contour utilizing a high precision inductive system with 20 Bit A/D converter. The measuring range is 6 mm, resolution 6 nm over the complete measuring range.
At the same time, evaluation of the geometric specifications and roughness parameters occurs, saving the user time and providing actionable results rapidly on the shop floor or in the measuring lab.
"The magnetic mounting guarantees simple and fast changing of the 75 mm tracing arm and offers maximum security," said a company spokesperson.
Wavecontour surfscan can be integrated into all measuring stations configured with the wavesystem components and the evaluation unit HOMMEL TESTER T8000. In combination with the waveline traverse units, tracing lengths of 60 - 200 mm are standard.
For more information contact:
Jenoptik Industrial Metrology
1505 West Hamlin Rd.
Rochester Hills, MI 48309
248-853-5888
www.jenoptik.com/industrial-metrology
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