White Light Measurement System

Hexagon Metrology has released WLS qFLASH, a compact white light solution (WLS) that utilizes blue light technology, for industrial measurement applications. The WLS qFLASH is a non-contact, stereovision system used to quickly capture 3D measurements on the shop floor. The portable system creates reports and digitizes acquired data on the spot for analysis or direct CAD comparison. Handheld or used on a mobile pedestal, the overall optical head design is easier to handle in limited or confined industrial spaces. The WLS qFLASH may be utilized for measuring aerospace components, automotive plastic parts or interiors, closures, aluminum and metal castings, medium sheet metal parts and molds and dies.

"The WLS qFLASH is wrapped in a carbon fiber optical housing and employs advanced blue LED high power illumination for reliable results," said a company spokesperson. "The system's rapid image acquisition provides high throughput by utilizing patented stereovision technology and 2D image processing to measure surfaces, closed features and edge lines. With low sensitivity to machinery vibration, industrial light or temperature changes, qFLASH enables manufacturers of small to medium size parts to measure surfaces and features in shop floor environments. Hexagon Metrology's patented stereovision technology allows the qFLASH to easily operate in production environments including stamping facilities and aircraft flight lines. The product is paired with Hexagon Metrology's proprietary CoreView measurement software suite."

The qFLASH stereovision technology enables image acquisition at an average of 10 milliseconds for constant measurement workflow. Shiny objects and surfaces can be measured without treatment. A random pattern is projected on a part, captured by the cameras and analyzed at sub pixel level, finding the differences in gray levels. Using the three cameras for triangulation, a 3D point cloud is reconstructed. Combined with 2D image analysis and propriety algorithms, the WLS qFLASH can extract closed features and edge points/lines without any post processing, such as STL generation. This gives the qFLASH the ability to output inspection studies based on dense point cloud and 2D image analysis.

The product also includes a reverse engineering image acquisition mode, which utilizes the sensor for both dimensional measurement and reverse engineering. Among the new capabilities of CoreView 7.0 software is STL on-the-fly functionality to generate high-quality data in the STL format for reverse engineering applications. This STL on-the-fly functionality is generated in the background so it will not slow down qFLASH's data acquisition.

For more information contact:

Cathy Hayat

Marketing Specialist

Hexagon Metrology, Inc.

1558 Todd Farm Drive

Elgin, IL 60123

Direct: 847-214-5263

Main: 847-931-0100 Ext. 5263

cathy.hayat@hexagonmetrology.com

www.hexagonmetrology.us