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CMSC 2019 Keynote Speaker Presents 'The Future of 3D Metrology'

The Coordinate Metrology Society (CMS) has announced Michael Raphael, President of Direct Dimensions and a veteran metrologist, will give the keynote address at the 2019 Coordinate Metrology Society Conference (CMSC) from July 22 – 26, 2019. The event will be at Renaissance Orlando at SeaWorld in Orlando, FL.  

 

This event will mark the 35th year of the premiere conference dedicated to portable and traditional coordinate measuring machine (CMM) measurement professionals. In keeping with the spirit of this landmark gathering, Raphael will address the CMS at 8:45 AM on Tuesday, July 23 with a presentation titled "The Future of 3D Metrology." Raphael will draw upon his 30-plus years of experience to cover the metrology field and explore the evolution of 3-D measurement solutions, scanning technologies and digital modeling solutions for the wide range of applications and industries.  

 
Raphael got his start in the field of 3-D metrology in 1985 as an engineer responsible for solving aerospace manufacturing problems. Raphael founded his company 
Direct Dimensions, Inc. (DDI) in 1995 to provide comprehensive 3-D technical services, product representations, sales and support for all types of 3-D scanning, imaging and dimensional measurement solutions.  The company employs nearly 30 technical and professional employees and performs hundreds of 3-D scanning and modeling projects every year. He graduated from Virginia Tech with a Bachelor of Science degree in Engineering Science and Mechanics, followed by a Master's degree in  Engineering Administration from George Washington University.

The Coordinate Metrology Society supports measurement professionals through education, certification and connects conference delegates to leading OEMs, software developers and service providers. The conference has gained worldwide distinction for its full slate of original technical papers from high-level speakers and leading metrology practitioners.

 

In the Education Zone, there will also be presentations from standards organizations, industry experts and STEM specialists. The five-day event caters to both master and novice users seeking an educational, dynamic atmosphere for career development. 

Attendees are offered a wide range of educational experiences from technical presentations to the CMSC Exhibition Hall, home of the Measurement and Education Zones. Each year, more than 45 exhibitors display and demonstrate state-of-the-art 3-D metrology solutions utilized in manufacturing, R&D and various scientific fields. The CMSC program rounds out with certification examinations, workshops, training courses, networking events, an optional local Friday tour and post-conference access to all technical papers and presentation materials.

 

For more information on the upcoming conference or to register, visit www.CMSC.org.

 

 

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