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November 14, 2024: Registration Open for New One-Day Surface Metrology and Tribology Class
November 14, 2024Registration is now open for Michigan Metrology's new one-day "Surface Metrology and Tribology" class. The in-person will be in Livonia, MI, November 14, 2024. The full-day class offers a unique opportunity to learn the fundamentals of surface roughness, friction and wear analysis, as well as their applications in manufacturing and product development.
“Over the years, many people have requested a one-day version of our annual, two-day texture and tribology short course,” said Don Cohen, PhD. “This new version of the class focuses on the material that matters most for the majority of people working with surface roughness and texture. For students looking for a deeper dive, the two-day class will still be held annually each spring.”
Topics for the one-day class include:
· Measuring surface roughness and waviness
· Instruments for surface measurement
· Filtering texture data
· Analysis techniques and tools
· Surface texture parameters
· Applications and case studies.
“We have been refining and expanding our classes for over 20 years,” Cohen said. “We are now able to offer both this one-day class and the more in-depth two-day short course. Both options are thorough and affordable opportunities to learn the fundamentals of surface texture analysis and its applications.”
Class details and registration are available at michmet.com/classes.
Registration requests can also be made by calling 866-953-5030 or emailing info@michmet.com.
Cohen established Michigan Metrology in 1994 to help engineers and scientists solve problems related to “squeaks, leaks, friction, wear, appearance, adhesion and other issues,” using 3D surface texture measurement and analysis.
Prior to forming Michigan Metrology, Cohen was V.P. of Engineering at WYKO Corporation (now part of Bruker Corporation), developing surface metrology instrumentation. He served as Vice Chairman/Chairman of the ANSI/ASME B46.1 Surface Texture Standards committee from 2000-2011 and is past Chairman of the STLE-Detroit section. He holds B.S. and M.S. degrees in Physics and a Ph.D. in Optical Sciences.
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