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August 2018

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Measuring Device for Roughness and Form Metrology

Jenoptik will debut the new generation of Waveline W800 roughness and contour measuring devices, designed to meet a variety of customer requirements for flexible, precise and fast measurement. The series includes four different configurations. A 120 mm traverse unit and 500 mm vertical measuring column are included on the basic configurations.

"An axis travel speed more than six times faster than previous models and an improvement in the ambient noise of approximately 30% demonstrate the performance improvement in comparison to the existing models," said a Jenoptik spokesperson.

The new W800 model series offers a probing system for every application so the instrument is well suited to many different measuring tasks in the measuring room, manual or semi-automated measuring processes. An additional benefit is the ease with which the probing systems can be swapped via a new magnetic quick-change adapter. This provides a high degree of flexibility to daily routine measurements. Measuring station configurations are modular and can easily be expanded at a later stage or integrated into existing measuring systems.

For more information contact:

JENOPTIK Advanced Systems, LLC

1500 W. Hamlin Road

Rochester Hills, MI 48309

248-537-1471

www.jenoptik.us

IMTS 2018 Level 3, Booth E-135536

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